Continuous improvement of process, product & service quality is the basis of customer satisfaction.
Management System Certification
We strictly adhere to international quality certification specifications and are committed to providing customers with high-quality and reliable products. All Semiware's manufacturing plants have passed IATF16949, ISO9001 quality management system certification; ISO14001, ISO45000 environmental and occupational health and safety certification; QC080000 hazardous substances certification.
Through daily practical actions, Semiware continues to exceed customer expectations, create more efficient and reliable semiconductor devices, and provide a faster and more complete service system. Every Semiware employee is responsible for providing high-quality service to internal and external customers. Continuous improvement of the quality of processes, products, and services is the basis for customer satisfaction.
If you experience product reliability issues, our Failure Analysis team is here to help. Contact your local sales representative to complete and submit a Failure Analysis Request Form. Our Customer Service team will promptly assess and address your issue.
Electrostatic GeneratorEquipment Model: ESD61002TA
Test Standards: EN/IEC 61000-4-2 and GB/T 17626.2
Discharge Modes: Contact discharge, Air discharge
Combined Surge GeneratorEquipment model: PRM17626
Test standards: IEC61000-4-5 and GB/T17626.5
Open circuit output voltage: 1.2/50us, 10/700us
Open circuit and short circuit current: 8/20us, 5/320us
8/20μs Surge testerEquipment model: SUG61005TB
Voltage wave: 1.2/50μs, 0.2~6kV
Current wave: 8/20μs, 0.1~3kA
Output impedance: combined wave-2Ω; insulation impedance-500Ω
Automotive Jamming SimulatorEquipment model: ISO7637 P2.b4
Stable voltage: 12V±0.2V; 24V±0.4V
First voltage drop Us: 6 to 7V; 12 to 16V
Second voltage drop Ua: 2.5 to 6V; 5 to 12V
6KV lightning surge generatorEquipment model: SUR 700
Standard: IEC 61000-4-5 and GB/T 17626.5
Waveform: CCITT; 10/700us; 5/320us
Output voltage: 0.2~6kV
ring wave generatorEquipment model: RWIT6
Standard: IEC61000-4-12 and GB/T17626.12
Output voltage: 0.2~6kV
Pulse polarity: positive, negative, positive first then negative, negative first then positive
X-Ray Detection MachineEquipment model: MVX2000
Function: Check product bonding wires, chip connections and lead frames, voids and bubbles, etc.
Ultrasound ScannerEquipment model: D9650
Function: Check delamination between devices, chip cracks, etc.
Electronic Digital MicroscopeEquipment model: VHX-7000N
Function: Check device appearance, cracks, contamination, scratches, oxide layer defects, etc.
Scanning Electron MicroscopeEquipment model: ISFE1050
Function: Qualitative and semi-quantitative analysis of analytical elements on the device surface
Slice GrinderEquipment model: SUC3200
Function: cross-section display of sample structure, search for internal structure or abnormal points
Film Thickness TesterEquipment model: FI-CH55
Applicable standards: GB/T16921-05 ISO3497
Applicable objects: electroplating coating thickness analysis and measurement
H3TRB SystemEquipment model: BTR-T671
Test standard: JESD22-A101
Function: Simulate the device's resistance to moisture under high temperature, high humidity, and bias conditions
HAST Testing SystemEquipment model: B-HAST-55
Test standard: JESD22-A110
Function: Evaluate the moisture resistance of non-hermetic packaged devices under bias
IOL Life Test SystemEquipment model: BTD-T810
Test standard: MIL-STD-750
Function: Evaluate the reliability of the product during repeated opening and closing processes
TCT Testing SystemEquipment model: LCJ-540
Test standard: JESD22-A104
Function: Evaluate a product’s ability to withstand alternating high and low temperature extremes
Salt Spray Corrosion ChamberEquipment model: YWX-2000
Test standard: GB/T.2423.17
Function: Evaluate the salt spray corrosion resistance quality of products or metal materials
HTRB SystemEquipment model: BTR-T600
Test standard: JESD22-A108
Function: Determine the effects of bias conditions and temperature on solid-state devices over time.
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