Summary

As a high-frequency hot-swappable interface, the USB 3.0 port is directly exposed to the external environment and is highly susceptible to electrostatic discharge (ESD) and transient high-voltage surges. Since the USB 3.0 port is often the "entry point" where external cables directly enter the motherboard, surges and static electricity entering through this point can damage not only the USB 3.0 port but also travel along power and ground lines to critical components such as the controller, DDR, and Flash memory. Therefore, the circuit protection scheme for the USB 3.0 interface aims to prevent damage to data and power lines from electrostatic discharge (ESD), electrical fast transients (EFT), surges, and other interference signals, ensuring interface reliability and system stability.

Testing Standards:
Contact-8kV Air-15kV